Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach

field_of_study

Blank

university

Al-Azhar University – Gaza

authors

Taya S.A.; Abu Nasr M.H.; El-Agez T.M.

authors_full_names

Taya, Sofyan A. (6701381761); Abu Nasr, Mustafa H. (56179552800); El-Agez, Taher M. (6508010303)

authors_id

6701381761; 56179552800; 6508010303

year

2013

source_title

Optica Applicata

article_title

Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach

volume

43

issue

4

page_start

817

page_end

829

publisher

Technical University of Wroclaw

affiliations

Physics Department, Islamic University of Gaza, Gaza, Palestine; Faculty of Engineering and Information Technology, Al Azhar University, Gaza, Palestine

authors_with_affiliations

Taya S.A., Physics Department, Islamic University of Gaza, Gaza, Palestine; Abu Nasr M.H., Faculty of Engineering and Information Technology, Al Azhar University, Gaza, Palestine; El-Agez T.M., Physics Department, Islamic University of Gaza, Gaza, Palestine

corresponding_author

S.A. Taya; Physics Department, Islamic University of Gaza, Gaza, Palestine; email: staya@iugaza.edu.ps

cited_by

2

doi

10.5277/oa130417

author_keywords

Bi-characteristic-impedance transmission line; BRAGG reflector; Ellipsometry.; Reflectance

index_keywords

Bragg reflectors; Electric lines; Multilayers; Reflection; Transfer matrix method; Transmission line theory; Bi-characteristic-impedance transmission lines; Ellipsometers; Ellipsometric parameters; Equivalent model; Multilayer structures; Number of layers; Transfer matrix approach; Ellipsometry