Characterization of SiO 2 thin film using rotating polarizer analyzer ellipsometer

field_of_study

Materials Science

university

Islamic University of Gaza

authors

El-Agez, T.M.; Taya, S.A.

authors_full_names

El-Agez, Taher M. (6508010303); Taya, Sofyan A. (6701381761)

authors_id

6508010303; 6701381761

year

2011

source_title

International Journal of Microwave and Optical Technology

article_title

Characterization of SiO 2 thin film using rotating polarizer analyzer ellipsometer

volume

6

issue

6

page_start

363

page_end

371

affiliations

Department of Physics, Islamic University of Gaza, Gaza, Palestine

authors_with_affiliations

El-Agez, Taher M., Department of Physics, Islamic University of Gaza, Gaza, Palestine; Taya, Sofyan A., Department of Physics, Islamic University of Gaza, Gaza, Palestine

corresponding_author

S.A. Taya; Physics Department, Islamic University of Gaza, Gaza, P.O. Box 108, Palestine; email: staya@iugaza.edu.ps

cited_by

3