Noise effect on thin film characterization using rotating polarizer analyzer ellipsometer

field_of_study

Physics Astro

university

Islamic University of Gaza

authors

El-Agez, T.M.; Taya, S.A.

authors_full_names

El-Agez, Taher M. (6508010303); Taya, Sofyan A. (6701381761)

authors_id

6508010303; 6701381761

year

2012

source_title

Acta Physica Polonica A

article_title

Noise effect on thin film characterization using rotating polarizer analyzer ellipsometer

volume

122

issue

1

page_start

15

page_end

19

publisher

Polish Academy of Sciences

affiliations

Department of Physics, Islamic University of Gaza, Gaza, Palestine

authors_with_affiliations

El-Agez, Taher M., Department of Physics, Islamic University of Gaza, Gaza, Palestine; Taya, Sofyan A., Department of Physics, Islamic University of Gaza, Gaza, Palestine

corresponding_author

S.A. Taya; Physics Department, Palestinian Authority, Islamic University of Gaza, Gaza, P.O. Box 108, Palestine; email: staya@iugaza.edu.ps

cited_by

2

doi

10.12693/APhysPolA.122.15